| | Jan 26, 2012 — Instron, a leading provider of testing equipment solutions designed to evaluate mechanical properties of materials and components, announces a new line of cost-effective retrofits, allowing you to get the most uptime and maximum performance from your existing testing system.
A 5900 EXTEND upgrade allows you to keep your existing load frame, grips, and load cells while replacing the older electronics and recording device with a new digital controller and signal conditioner, along with a new Productivity Panel (exclusive to the 5900 Series) and advanced testing software.
Each Instron retrofit kit is designed for a specific frame, and includes all new wiring harnesses, brackets, cables and other OEM components – to protect you and your investment by retaining or enhancing safety, increasing reliability, and reducing expensive downtime and repairs.
The 5900 Digital Signal Processing (DSP) unit delivers high speed, closed-loop control, sensor conditioning, high-speed data acquisition, and diagnostic displays, and provides easy connection for all transducers, computer, and service ports.
The all-new Productivity Panel includes a combination of action keys and live displays to facilitate testing and improve efficiency. Mounted to the frame, the panel allows the operator to start, stop, reset gauge length, adjust the crosshead with both a fine and coarse adjustment, and view a series of configurable live displays that include standard measurements and real-time results.
Designed as the most powerful and flexible material testing package available, Bluehill 3 contains enhancements and features that are designed specifically with the end-user in mind. From improvements to the navigation and help systems to powerful and flexible calculation and data analysis routines, Bluehill 3 meets the demands of any level of user from educators and test technicians to quality engineers and laboratory managers. It also offers a convenient conversion program to ensure compatibility of existing Merlin™ or Series IX™ test methods and data. | |
